Tender Information

Department of Higher Education
NTID 17780057
Tendering Authority Department of Higher Education
Description purchase and installation of equipment for various departments - kit to study the i-v characteristics of the ujt, kit to study the i-v characteristics of the scr, kit to study the i-v characteristics of mosfet.kit to study the characteristics of solar cell., kit to study the class a, b and c power amplifier., kit to study the colpitt's oscillator., kit to study the hartley's oscillator., kit to study the phase shift oscillator, kit to design multi range ammeter and voltmeter using galvanometer., kit to measure the resistance by wheatstone bridge and measurement of bridge sensitivity, kit to measure the capacitance by de'sautys., kit to measure the low resistance by kelvin's double bridge., kit to design and implementation of instrumentation amplifier using 741 op-amp., kit to determine the characteristics of resistance transducer- strain gauge (measurement of strain using half and full bridge).kit to determine the characteristics of lvdt., kit to determine the characteristics of thermistors and rtd., kit to measure the temperature by thermocouples and study of transducers like ad590 (two terminal temperature sensor), pt-100, j- type, k-type., kit to study the characteristics of ldr, photodiode, and phototransistor:a) variable illumination.b) linear displacement., kit to design and implementation of temperature controller., kit to study the amplitude modulation and demodulation, kit to study the frequency modulation demodulation., kit to study the pulse amplitude modulation, am transmitter/receiver kit, fm transmitter/receiver kit, time division multiplexing kitfrequency division multiplexing kit, kit to study of pulse width modulation., kit to study of pulse position modulation., kit to study of pulse code modulation., kit to study of amplitude shift keying., kit to study of phase shift keying., kit to study of frequency shift keying., to verify the law of malus for plane polarized light., measurement of planck’s constant using leds., measurement of boltzman’s constant using semiconductor diode., to determine the resolving power and dispersive power of diffraction grating.diffraction experiments using a laser., to determine the specific rotation of scan sugar using polarimeter., to determine characteristics of leds and photo- detector., to measure the numerical aperture of an optical fiber., study of the i-v characteristics of the ujt., study of the i-v characteristics of the scr., study of the i-v characteristics of mosfet., study of characteristics of solar cell., study of hall effect/measurement of temperature sensitivity of carrier concentration., study of class a, b and c power amplifier., study of the colpitt's oscillator.study of the hartley's oscillator., study of the phase shift oscillator, design of multi range ammeter and voltmeter using galvanometer., measurement of resistance by wheatstone bridge and measurement of bridge sensitivity., measurement of capacitance by de'sautys., study of the i-v characteristics of the ujt., study of the i-v characteristics of the scr., study of the i-v characteristics of mosfet., study of characteristics of solar cell., study of hall effect/measurement of temperature sensitivity of carrier concentration., study of class a, b and c power amplifier.study of the colpitt's oscillator., study of the hartley's oscillator., study of the phase shift oscillator, design of multi range ammeter and voltmeter using galvanometer., measurement of resistance by wheatstone bridge and measurement of bridge sensitivity., measurement of capacitance by de'sautys., measure of low resistance by kelvin's double bridge., design and implementation of instrumentation amplifier using 741 op-amp., to determine the characteristics of resistance transducer- strain gauge (measurement of strain using half and full bridge)., to determine the characteristics of lvdt., to determine the characteristics of thermistors and rtd.measurement of temperature by thermocouples and study of transducers like ad590 (two terminal temperature sensor), pt-100, j- type, k-type., to study the characteristics of ldr, photodiode, and phototransistor:a) variable illumination.b) linear displacement., design and implementation of temperature controller., study of amplitude modulation., study of amplitude demodulation., study of frequency modulation., study of frequency demodulation., pulse amplitude modulation., am transmitter/receiver., fm transmitter/receiver., study of tdm, fdm.study of pulse width modulation., study of pulse code modulation., study of amplitude shift keying., study of phase shift keying., study of frequency shift keying., to verify the law of malus for plane polarized light., michelson's interferometer., to determine wavelength of sodium light using newton's rings., to determine the resolving power and dispersive power of diffraction grating., diffraction experiments using a laser., study of faraday rotation.study of electro-optic effect., to determine the specific rotation of scan sugar using polarimeter., to determine characteristics of leds and photo- detector., to measure the numerical aperture of an optical fiber.
Estimated Cost 0.00
EMD
Doc Cost 0.00
Last Date for Submission 2019-01-12
Closing Date 2019-01-12
Location Department of Higher Education India, West Bengal, Kolkata
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